Waferpedia

Comparison ledger

S 9260 A CD-SEMversus1.112 PSL Wafer

Hitachi S 9260 A CD-SEM, KLA 1.112 PSL Wafer, side by side. Every value shown is drawn from the cited encyclopedia entries.

Email
Side-by-side comparison of selected equipment models
Attribute
OEMHitachiKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyHitachi S 9260KLA 1.112 PSL Wafer
Specifications
ConfigurationSingle phase[1]NIST Traceable[5]
MakeHitachi[2]—
ModelS 9260 A[2]—
Wafer Size8 inch[1]8 inch[5]
Power ConfigurationSingle phase[1]—
OEMHitachi[2]—
Tool typeCritical Dimension Scanning Electron Microscope (CD-SEM)[2]—
Vintage2007[2]—
NIST Traceable—True[5]
Compatible Tools—Surfscan 6xy0 and Sp1[6]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (6)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]Equipment inventory listing
  3. [3]Equipment inventory listing
  4. [4]Equipment inventory listing
  5. [5]inventory listing
  6. [6]waferpedia.comwaferpedia.com