Comparison ledger
KLA .496 PSL Wafer, KLA Candela 7100 Hard Disk Surface Analyzer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .496 PSL Wafer | KLA Candela |
| Specifications | ||
| Configuration | NIST Traceable[1] | Defects and Classifies:[3] |
| Wafer size | 8 inch[1] | — |
| Traceability | NIST Traceable[1] | — |
| Compatible systems | Capable on Surfscan 6xy0 and SP1[1] | — |
| Category | Metrology & Inspection[2] | — |
| OEM | — | KLA[3] |
| Model | — | Candela 7100[3] |
| Equipment name | — | Candela 7100 Hard Disk Surface Analyzer[3] |
| Defects and classifies | — | HDD sub-micron bits; bumps; particles; buried defects on metal and glass[3] |
| Use cases | — | Defect inspection; scratch and ridge inspection; particle and stain inspection; laser texture analysis; carbon uniformity analysis and carbon void inspection; recording layer and soft under layer mapping; lube uniformity analysis; magnetic imaging[3] |
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