Comparison ledger
KLA .496 PSL Wafer, KLA Surfscan 7200 Particle Defect, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .496 PSL Wafer | KLA Surfscan 7200 Particle Defect |
| Specifications | ||
| Configuration | NIST Traceable[1] | — |
| Wafer size | 8 inch[1] | — |
| Traceability | NIST Traceable[1] | — |
| Compatible systems | Capable on Surfscan 6xy0 and SP1[1] | — |
| Category | Metrology & Inspection[2] | — |
| OEM | — | KLA[3] |
| Model | — | Surfscan 7200[3] |
| Product type | — | Particle Defect System[3] |
| Wafer sizes | — | 6, 8 inch[3] |
| Vintage (asset 84685) | — | 1991[3] |
| Vintage (asset 84684) | — | 1990[4] |
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