Comparison ledger
KLA .498 PSL Wafer, Nikon NWL 860 T Automatic Wafer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | Nikon |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .498 PSL Wafer | Nikon NWL 860 |
| Specifications | ||
| Configuration | NIST Traceable[1] | With Nikon Optiphot 200 Microscope[2] |
| NIST traceability | Yes[1] | — |
| OEM | KLA[1] | — |
| Category | Metrology & Inspection[1] | — |
| Traceability | Yes[1] | — |
| Description | Particle-sizing calibration standard[1] | — |
| Asset # | — | 71967[2] |
| Make | — | Nikon[2] |
| Model | — | NWL 860 T[2] |
| Vintage | — | 1998[2] |
| Includes | — | Nikon Optiphot 200 Microscope[2] |
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