Comparison ledger
Micromanipulator Wafer, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | WaferMicromanipulator | |
|---|---|---|
| OEM | Micromanipulator | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Micromanipulator Wafer | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | with New Wave LCSII 532 System[1] | — |
| Wafer size range | 150 mm (6 inch) to 300 mm (12 inch)[2] | — |
| Type | Manual probe station[2] | — |
| Low Current/Low Noise | Ready[2] | — |
| Chuck | Kelvin chuck wiring[2] | — |
| Thermal chuck | Integrated wiring and plumbing[2] | — |
| Base | Vibration dampened[2] | — |
| Platen | Large area magnetic stainless steel[2] | — |
| Microscope bridge | Heavy duty, motorized drive, 8-inch focus block[2] | — |
| Control | Front panel MicroTouch knobs, automatic functions keypad, optional joystick/remote pendant[2] | +/-1.0°C[3] |
| Upgradeable to | Semi-Automatic 9920[2] | — |
| OEM | Micromanipulator[1] | — |
| Model | Wafer[1] | JR-A-F4T[3] |
| Category | Test & Probe[1] | — |
| Wafer sizes | 8 inch[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Manufacturer | — | Tenney[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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