Comparison ledger
Multitest 9510, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 9510Multitest | |
|---|---|---|
| OEM | Multitest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | 2001– | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Multitest 9510 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants | — | |
| Specifications | ||
| Configuration | Has a lot of change kits[3] | — |
| Equipment type | Test handler family[2] | — |
| Application | Semiconductor test and probe[2] | — |
| Parallelism | Up to x16 test site parallelism[2] | — |
| Temperature range | -55°C to +150°C[1] | — |
| Variant | Tri-temp and pick-and-place variants[2] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Model | — | JR-A-F4T[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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