Comparison ledger
Multitest InStrip, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | InStripMultitest | |
|---|---|---|
| OEM | Multitest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Multitest InStrip | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants |
| — |
| Specifications | ||
| Configuration | Inflip Module[2] | — |
| Conversion Kit | LGA14 3x5 / LGA 4x4 / LGA 5x5[5] | — |
| Type | Test handler for singulated devices[6] | — |
| Device handling | Carrier-based for singulated packages[6] | — |
| Multi-site testing | Yes (parallel testing of multiple devices)[6] | — |
| Chamber Size | — | 1.2 cubic feet[7] |
| Temperature Range | — | -68°C to +180°C[7] |
| Control | — | +/-1.0°C[7] |
| Manufacturer | — | Tenney[7] |
| Model | — | JR-A-F4T[7] |
| Short description | — | Junior compact temperature test chambers[7] |
| Control accuracy | — | +/-1.0°C[7] |
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