Comparison ledger
Rorze 03 RR 8120-001-001 Wafer Exchanger, Teradyne Spectrum 8855, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Spectrum 8855Teradyne | |
|---|---|---|
| OEM | Rorze | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Rorze 03 RR 8120-001-001 Wafer Exchanger | Teradyne Spectrum |
| Specifications | ||
| Wafer size | 8 inch[1] | — |
| Manufacturer | Rorze[1] | Teradyne[3] |
| Model | 03 RR 8120-001-001[1] | Spectrum 8855[3] |
| Equipment type | Wafer Exchanger[1] | Tester[3] |
| Power | — | 5.50v, 200.00w[3] |
| Configuration | — | Hardware scan table[3] |
| 5.50V power rail | — | 200W[3] |
| 24V power rail | — | 50W[3] |
| 52V power rail | — | 200W[3] |
| VXI card cage | — | Extended for 3rd party C-sized VXI instruments[5] |
| Hardware scan table | — | Included[3] |
| VXI-MXI-2 | — | Included[3] |
| Board configuration (asset 75212) | — | FIB/DeltaScan board, VP board (3), CC2a master and expander board (36)[3] |
| Board configuration (asset 75211) | — | High voltage PRISM board, VP board (2), CC2a master and expander board (24)[4] |
| Hardware | — | Hardware scan table; VXI-MXI-2; FIB / DeltaScan board; VP board (3); CC2a master and expander board (36)[3] |
| Vintage | — | 2005[3] |
| Test capabilities | — | Analog test; vectorless test; digital and mixed-signal vector test; boundary-scan test[5] |
| Device programming | — | In-line device programming of Flash, EEPROM, and FPGAs[5] |
| Card cage | — | Extended VXI card cage for integration of 3rd party C-sized VXI instruments[5] |
| Product type | — | Tester[3] |
| Feature set | — | Analog test, vectorless test, digital and mixed-signal vector test, and boundary-scan test capabilities[5] |
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