Comparison ledger
AccoTest STS 8200, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | STS 8200AccoTest | |
|---|---|---|
| OEM | AccoTest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | AccoTest STS 8200 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Make | AccoTest[1] | — |
| Model | STS 8200[1] | JR-A-F4T[3] |
| Configuration | Twin, dual-cage test system[1] | — |
| Instrument configuration | Identical A-side / B-side instrument configuration[1] | — |
| Installed instrument boards | 26 installed instrument boards (13 per cage)[1] | — |
| Floating source modules | FOVI Floating Source Modules (40V / 100mA / 1A pulsed)[1] | — |
| Floating power modules | FPV110 Plus Floating Power Modules (100V / 10A pulsed)[1] | — |
| Voltage meter | QVM Quad Voltage Meter (18-bit)[1] | — |
| Timing measurement unit | QTMU Plus II Quad Timing Measurement Unit[1] | — |
| Digital I/O | DIO 2.0 Plus Digital I/O (8-channel, 5 MHz, 1M vector memory)[1] | — |
| Control bit module | Cbit128 Control Bit Module[1] | — |
| Product type | Analog and Power Test System[2] | — |
| Mainframe slots | 26 universal slots[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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