Comparison ledger
Accretech AP 3000 e, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | AP 3000 eAccretech | |
|---|---|---|
| OEM | Accretech | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Accretech AP 3000 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants |
| — |
| Specifications | ||
| Configuration | Tri-temp prober compatible with HP93K 12" POGO type tester[2] | — |
| Temperature capability | Tri-temp[3] | — |
| Tester compatibility | HP93K 12-inch POGO type tester[2] | — |
| Type | automatic wafer prober[4] | — |
| Wafer size | 200mm (8-inch) and 300mm (12-inch)[4] | — |
| Precision | +/- 0.8um and +/-1.5um overall precision (Accretech specified condition)[5] | — |
| Operating characteristics | high precision wafer probing at low vibration and low noise levels[5] | — |
| Automation | single or dual loader with AMHS automation[5] | — |
| Options | automatic probe card exchange (APC)[5] | — |
| Chamber Size | — | 1.2 cubic feet[6] |
| Temperature Range | — | -68°C to +180°C[6] |
| Control | — | +/-1.0°C[6] |
| Manufacturer | — | Tenney[6] |
| Model | — | JR-A-F4T[6] |
| Short description | — | Junior compact temperature test chambers[6] |
| Control accuracy | — | +/-1.0°C[6] |
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