Comparison ledger
Accretech APM 90 A, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | APM 90 AAccretech | |
|---|---|---|
| OEM | Accretech | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Accretech APM 90 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| CPU | AVME 127[1] | — |
| Chuck System | TSK Hot Chuck 30-155 C[1] | — |
| Chuck Planarity | <15 um[2] | — |
| PC Adapter | Diameter 200 mm, Clamped Manually[1] | — |
| Manipulator | N/A[1] | — |
| Manufacturer | Accretech[1] | Tenney[4] |
| Model | APM 90 A[1] | JR-A-F4T[4] |
| Category | Test & Probe[1] | — |
| Tool type | Prober[1] | — |
| Wafer size compatibility | 6-inch and 8-inch wafers[3] | — |
| Chuck planarity | <15 um[1] | — |
| Vintage | 1996[1] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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