Accretech
The Accretech APM 90 A is a semiconductor prober for test and probe work. The Accretech APM 90 A uses a TSK hot chuck, a manually clamped 200 mm PC adapter, and an AVME 127 CPU. The Accretech APM 90 A supports 6-inch and 8-inch wafers.[1][2]

The APM 90 A is used for chip probing and process control monitoring.[8]
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
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Machines of this class can test a wide range of semiconductor devices, including logic, memory, analog, and mixed-signal integrated circuits, as well as discrete components like diodes and transistors.
Many probing systems in this class incorporate a thermal chuck that can heat or cool the wafer over a controlled temperature range, enabling device characterization under specified thermal conditions.
Throughput depends on factors like stepping speed, test time per device, and probe card configuration; class-level specifications are determined by the tester and handler integration.
Probing systems of this class are typically designed to accommodate a range of wafer diameters, with stage travel and chuck size matched to the specific platform, though exact sizes are model-dependent.
The following facts about the APM 90 A are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the APM 90 A are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the APM 90 A are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the APM 90 A are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the APM 90 A are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the APM 90 A is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 7, 2026.
The Signatone CM-210 is a 200mm high precision manual probe system designed for on-wafer analytical measurements including DC, CV/IV, high power, and RF test.
The Tenney TPS JR-A-F4T is a junior compact temperature test chamber with a 1.2 cubic foot chamber size and a temperature range of -68°C to +180°C.
The Rorze 03 RR 8120-001-001 is a wafer exchanger for 8-inch wafers.