Comparison ledger
Advantest T 2000, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 2000Advantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 2000 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | SGM16 (Sync Gen/Matrix16) = 1pcs[1] | — |
| Architecture standard | OPENSTAR[4] | — |
| Operating system | Microsoft Windows[4] | — |
| Programming environment | C++ (Microsoft Visual Studio 2005 Professional Edition)[4] | — |
| Test programming language | OTPL (Open Architecture Test Programming Language)[4] | — |
| Offline environment | T2000 System Software Emulator[4] | — |
| Test tools | Wave Tool (Logic Analyzer, Oscilloscope), Shmoo, Pattern Editor[4] | — |
| Make | Advantest[1] | — |
| Model | T 2000[1] | JR-A-F4T[5] |
| Type | RF Tester[1] | — |
| Included modules | SGM16 (Sync Gen/Matrix16) = 1pcs; 12GWSGA (12Ghz cellular/W-Lan Signal Generator/Analyzer) = 1pcs; DPS500 (500mA Device Power Supply) = 2pcs; RC5V (Relay Control 5V) = 1pcs; 2.5G Noise Source = 1pcs[1] | — |
| Description | Tester[2] | — |
| Condition | Defective[2] | — |
| Base operating system | Microsoft Windows[4] | — |
| Programming language | C++ (Microsoft Visual Studio 2005 Professional Edition)[4] | — |
| Interface language | OTPL (Open Architecture Test Programing Language)[4] | — |
| Equipment type | RF Tester[1] | — |
| Chamber Size | — | 1.2 cubic feet[5] |
| Temperature Range | — | -68°C to +180°C[5] |
| Control | — | +/-1.0°C[5] |
| Manufacturer | — | Tenney[5] |
| Short description | — | Junior compact temperature test chambers[5] |
| Control accuracy | — | +/-1.0°C[5] |
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