Advantest
The Advantest T 2000 is an open-architecture SoC test system that adopts the OPENSTAR standard. The T 2000 uses Microsoft Windows as its base operating system. The T 2000 supports test applications for digital consumer, MPU, RF, CMOS image sensor, and integrated power devices.[1]

Automatic test equipment applies electrical stimuli to semiconductor devices and measures the responses against programmed limits. Test systems of this class are used to verify device functionality, parametric behavior, and interface performance during device development and manufacturing. Probe configurations are commonly used before singulation by contacting die on a wafer, while packaged-device configurations are used later in backend test flow.
Test and probe equipment sits in electrical verification steps rather than in deposition, lithography, etch, or metrology steps. In wafer sort, a tester works with probe hardware to screen die on the wafer before assembly. In final test, a tester exercises packaged devices after assembly and often after burn-in or other reliability-related screens.
Automatic test equipment of this class is used for logic, mixed-signal, RF, sensor, and power semiconductor devices. Engineers use such platforms for device characterization, production screening, debug, and yield monitoring across wafer-level and package-level electrical test operations.
Documented failure modes, common issues, and field considerations.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
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The T2000 uses Microsoft Windows as its base operating system.[1]
Yes, the T2000 can be configured as an RF tester, for example with an SGM16 sync gen/matrix, a 12GWSGA (12 GHz cellular/W-Lan signal generator/analyzer), and a 2.5G noise source.[2]
The T2000 supports test solutions for digital consumer products, microprocessors, RF devices, CMOS image sensors, integrated power devices, and an enhanced performance package.[1]
The following facts about the T 2000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the T 2000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the T 2000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the T 2000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the T 2000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly hosted manuals, SOPs, or datasheets for the T 2000 are on record.
Answerable by: university cleanroom staff or an OEM application specialist
Last updated Oct 15, 2026.
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