Comparison ledger
Advantest T 5501, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5501Advantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5501 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | parts machine[1] | — |
| Test target devices | GDDR3/4-SDRAM, SRAM, DDR3-SDRAM, etc.[2] | — |
| Maximum number of devices per system | 32[2] | — |
| Maximum test rate | 1.066 GHz / 2.133 GHz (DDR mode)[2] | — |
| Maximum test rate (single-edge) | 1.066 GHz[2] | — |
| Maximum test rate (DDR mode) | 2.133 GHz[2] | — |
| Supported memory types | GDDR3/4-SDRAM, SRAM, DDR3-SDRAM[2] | — |
| Product type | Tester[3] | — |
| Make | Advantest[3] | — |
| Model | T 5501[3] | JR-A-F4T[4] |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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