Advantest

T 5501

Research Quality: 40% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The Advantest T 5501 is a memory test system. The T 5501 supports GDDR3/4-SDRAM, SRAM, and DDR3-SDRAM memory devices. The T 5501 offers a maximum test rate of 1.066 GHz (2.133 GHz in DDR mode).^[1]

Fig. — Manufacturer logo, not a photo of this toolWikimedia Commons (see file page for license)

What it is

The Advantest T 5501 is a memory test system. The Advantest T 5501 supports GDDR3/4-SDRAM, SRAM, and DDR3-SDRAM memory devices.^[1]^[3]

How it works

The Advantest T 5501 supports source-synchronous measurement. The Advantest T 5501 uses a multi-strobe function to judge phase differences between device output data and a reference clock signal on a cycle-by-cycle basis. The Advantest T 5501 can perform measurement on up to 32 channels. The Advantest T 5501 offers a maximum test rate of 1.066 GHz, or 2.133 GHz in DDR mode.^[1]^[3]

Where it fits in the process flow

General reference — not yet source-verified

A semiconductor memory tester belongs in the electrical test portion of device manufacturing. Memory testers are used after wafer fabrication when memory die or packaged memory devices need functional and parametric verification before later sorting, assembly progression, or outgoing qualification.

Applications

The Advantest T 5501 is intended for testing GDDR3/4-SDRAM, SRAM, and DDR3-SDRAM devices.^[1]^[3]

What do the numbers mean?

Configuration & options10

parts machine^[2]
Test target devices: GDDR3/4-SDRAM, SRAM, DDR3-SDRAM, etc.^[1]
Maximum number of devices per system: 32^[1]2 sources
Maximum test rate: 1.066 GHz / 2.133 GHz (DDR mode)^[1]2 sources
Maximum test rate (single-edge): 1.066 GHz^[1]
Maximum test rate (DDR mode): 2.133 GHz^[1]
Supported memory types: GDDR3/4-SDRAM, SRAM, DDR3-SDRAM^[1]2 sources
Product type: Tester^[3]
Make: Advantest^[3]
Model: T 5501^[3]

Interested in this tool?

Need help with this tool?Embed spec card

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Worked with this tool? Help preserve its knowledge →

Frequently asked questions

What kind of equipment is the Advantest T 5501?

The Advantest T 5501 is a memory test system.^[1]^[3]

Which device types does the Advantest T 5501 support?

The Advantest T 5501 supports GDDR3/4-SDRAM, SRAM, and DDR3-SDRAM devices.^[1]^[3]

What is the maximum test rate of the Advantest T 5501?

The Advantest T 5501 has a maximum test rate of 1.066 GHz, or 2.133 GHz in DDR mode.^[1]^[3]

How many devices can the Advantest T 5501 handle per system?

The Advantest T 5501 supports up to 32 devices per system.^[1]^[3]

Not publicly documented

The following facts about the T 5501 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the T 5501 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the T 5501 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the T 5501 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the T 5501 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the T 5501 is not on record.
Answerable by: an OEM datasheet or a fab qualification report