Comparison ledger
Advantest T 5585, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5585Advantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5585 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants |
| — |
| Specifications | ||
| Configuration | HDD and Software included[2] | — |
| Target devices | SDRAM, DDR-SDRAM, SSRAM[1] | — |
| Test frequency | 250/500 MHz (DDR mode)[1] | — |
| Test timing accuracy | ±400 ps[1] | — |
| Max simultaneous test count | 256 (128 × 2 stations × 8/9 bit)[1] | — |
| DC test units | 32 (standard), 64 (maximum)[1] | — |
| Programmable power supplies | 64 (standard), 192 (maximum)[1] | — |
| Pattern generator | ALPG X16, Y16, D18×2[1] | — |
| Options | DBM, AFM, PM[1] | — |
| Wafer size | 8 inch[3] | — |
| Make | Advantest[4] | — |
| Model | T 5585[4] | JR-A-F4T[5] |
| Equipment type | Tester[4] | — |
| Core boards | PPS Boards (Pattern Pin Supply) – BGR‑022365 (Qty 8, dual head configuration); CAL/SIG Board – BGR 024351; STRB GEN Board – BGR 024444; TGFC IF Board – BGR 024356; SC DIST Board – BGR 024362; SC IF Board – BGR 024361; SCU Backplane – BLZ 024360; Test Head VIO I/F – BGR 024353; Dummy PE Boards – BGR 025800[2] | — |
| Vintage | 2001[2] | — |
| Chamber Size | — | 1.2 cubic feet[5] |
| Temperature Range | — | -68°C to +180°C[5] |
| Control | — | +/-1.0°C[5] |
| Manufacturer | — | Tenney[5] |
| Short description | — | Junior compact temperature test chambers[5] |
| Control accuracy | — | +/-1.0°C[5] |
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