Comparison ledger
Advantest T 5588 Memory Tester Parts, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5588 Memory Tester PartsAdvantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5588 Memory Tester Parts | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Test Speed | 400 MHz/800 Mbps[1] | — |
| Simultaneous Testing | Up to 512 devices per system[1] | — |
| Target Devices | DDR2-SDRAMs, FLASH memories[1] | — |
| Operating System | FutureSuite[1] | — |
| Chamber Size | — | 1.2 cubic feet[2] |
| Temperature Range | — | -68°C to +180°C[2] |
| Control | — | +/-1.0°C[2] |
| Manufacturer | — | Tenney[2] |
| Model | — | JR-A-F4T[2] |
| Short description | — | Junior compact temperature test chambers[2] |
| Control accuracy | — | +/-1.0°C[2] |
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