Advantest
T 5588 Memory Tester Parts
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Advantest T 5588 is a memory test system designed for high-throughput mass-production testing of high-speed devices such as DDR2-SDRAMs. The T 5588 achieves a maximum testing rate of 800 Mbps and supports simultaneous testing of up to 512 devices. The T 5588 is the first DRAM package tester to offer an optional flash memory test function.[1]
What it is
General reference — not yet source-verifiedMemory testers are semiconductor test systems used to verify the functionality and performance of memory devices. Memory testers apply electrical test patterns and compare the output of the device under test against expected results.
How it works
General reference — not yet source-verifiedMemory testers generate test patterns and apply them to the memory device through a set of drivers and receivers. The tester compares the device output to expected values to detect faults.
Where it fits in the process flow
General reference — not yet source-verifiedMemory testers are used in the back-end of semiconductor manufacturing, typically after wafer dicing and packaging. Memory testers perform final test on packaged devices to ensure they meet specifications before shipment.
Applications
General reference — not yet source-verifiedMemory testers are used to test a variety of memory devices including DRAM, SRAM, and flash memory, in both wafer probe and final test stages.
What do the numbers mean?
Power & electrical1
Control & software1
Configuration & options2
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- Test Speed400 MHz/800 Mbps[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Not publicly documented
The following facts about the T 5588 Memory Tester Parts are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the T 5588 Memory Tester Parts are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the T 5588 Memory Tester Parts are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the T 5588 Memory Tester Parts are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the T 5588 Memory Tester Parts are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the T 5588 Memory Tester Parts is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]www3.advantest.com — www3.advantest.comwww3.advantest.com
- [2]Equipment inventory listing
Last updated Aug 20, 2026.
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