Comparison ledger
Advantest T5375 Automated, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T5375 AutomatedAdvantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T5375 Automated | KLA 1007 |
| Specifications | ||
| Attachments | 8 Files[1] | — |
| Equipment type | Automated Test Equipment[1] | Prober[4] |
| Function | Memory Tester[2] | — |
| Handler model | M6771AD (optional)[2] | — |
| Heads configuration | TH+MAIN+WS heads[1] | — |
| FRMA heads | 1[1] | — |
| FRMA channels per head | 8[1] | — |
| Manufacturer | — | KLA[3] |
| Model | — | 1007[3] |
| Description | — | Wafer Prober[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Vintage | — | 01.06.1995[3] |
| Make | — | KLA[4] |
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