KLA
1007
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
How it works
General reference — not yet source-verifiedThe KLA 1007 positions a wafer on a precision chuck that moves the wafer under a probe card. The probe card contains fine needles that align to the bond pads of each die. The machine then lowers the card to make contact, enabling electrical tests to be performed by a test head connected to the system.
Where it fits in the process flow
General reference — not yet source-verifiedWafer probers are used in the semiconductor test flow after wafer fabrication is complete and before the wafer is diced into individual chips. The KLA 1007 performs sort testing at the wafer level, identifying known good die and marking defective die for rejection.
What do the numbers mean?
Wafer handling3
Configuration & options3
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the 1007 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 1007 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 1007 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 1007 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 1007 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 1007 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (8)Every fact above is drawn from these public sources
- [1]fabsurplus.com — fabsurplus.comfabsurplus.com
- [2]Equipment inventory listing
- [3]Equipment inventory listing
- [4]Equipment inventory listing
- [5]Equipment inventory listing
- [6]Equipment inventory listing
- [7]KLA 1007 Wafer Prober for sale / JMC Worldwide Semiconductor Equipment — jmcserv.comjmcserv.com
- [8]Equipment inventory listing
Last updated Aug 13, 2026.
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