Comparison ledger
Advantest V 93000 PS 400, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | V 93000 PS 400Advantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest V 93000 PS 400 | KLA 1007 |
| Specifications | ||
| CTH | 1/STH:2/ATH:1[1] | — |
| Make | Advantest[1] | KLA[5] |
| Model | V 93000 PS 400[1] | 1007[4] |
| Tool type | semiconductor test system[2] | — |
| Category | Test & Probe[2] | — |
| Test head | CTH - Compact Test Head[2] | — |
| Card/Board | PS 400 (4x)[2] | — |
| Operating system | Dual OS: Redhat 5.6 & 5.8[2] | — |
| Software version Redhat 5.6 | SMT 6.5.3; 6.5.4: 7.1.2.3[2] | — |
| Software version Redhat 5.8 | SMT 7.1.2.3; 7.2.0.9; 7.2.3.0[2] | — |
| Workstation | HP Z 800[2] | — |
| Configuration & options | CTH 1/STH:2/ATH:1[3] | — |
| Manufacturer | — | KLA[4] |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Equipment type | — | Prober[5] |
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