Comparison ledger
Advantest V 93000 SOC Series LTH TSL 612, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | V 93000 SOC Series LTH TSL 612Advantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest V 93000 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Version | LTH[1] | — |
| Configuration | Digital C200e 884ch[1] | — |
| Cooling unit | E2760FA[1] | — |
| W/S | xw8200 (3.6GHz x 2)[2] | — |
| Digital | C200e 884ch[1] | — |
| DPS | GPDPS 24ch[2] | — |
| Analog | N/A[2] | — |
| Vintage | 2004[2] | — |
| Workstation | xw8200 (3.6GHz x 2)[2] | — |
| OEM | Advantest[1] | — |
| Model | V 93000 SOC Series LTH TSL 612[1] | JR-A-F4T[4] |
| Category | Test & Probe[3] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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