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V 93000 SOC Series LTH TSL 612

Test & ProbeAdvantest V 93000 family
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V 93000 SOC Series LTH TSL 612 — Inventory photo
Fig. 01V 93000 SOC Series LTH TSL 612Inventory photo[1]

What it is

The Advantest V 93000 SOC Series LTH TSL 612 is a semiconductor tester in the test and probe category.[1][3]

How it works

General reference — not yet source-verified

A semiconductor tester applies controlled signals, measures device responses, and compares the responses against expected behavior to sort and qualify parts.

A test and probe system is used with probe hardware to contact devices before full package test or as part of wafer-level electrical evaluation.

Where it fits in the process flow

General reference — not yet source-verified

The Advantest V 93000 SOC Series LTH TSL 612 belongs in the electrical test flow for integrated circuits rather than in wafer fabrication steps that change the device structure.

The Advantest V 93000 SOC Series LTH TSL 612 can sit at the stage where devices are contacted for measurement and screening before downstream assembly or final product qualification.

Applications

General reference — not yet source-verified

The Advantest V 93000 SOC Series LTH TSL 612 is suited to testing system-on-chip and other integrated devices that require mixed-signal electrical verification.

What do the numbers mean?

Configuration & options17

Version
LTH[1]
Accurate?
Digital C200e 884ch[1]
Accurate?
DPS GPDPS 24ch[1]
Accurate?
Analog N/A[1]
Accurate?
Cooling unit
E2760FA[1]
Accurate?
Digital C200e 884ch, C4000e 16ch[2]
Accurate?
DPS GPDPS 24ch[2]
Accurate?
W/S
xw8200 (3.6GHz x 2)[2]
Accurate?
Digital
C200e 884ch[1]
Accurate?
DPS
GPDPS 24ch[2]
Accurate?
Analog
N/A[2]
Accurate?
Vintage
2004[2]
Accurate?
Digital
C200e 884ch, C4000e 16ch[2]
Accurate?
Workstation
xw8200 (3.6GHz x 2)[2]
Accurate?
OEM
Advantest[1]
Accurate?
Model
V 93000 SOC Series LTH TSL 612[1]
Accurate?
Category
Test & Probe[3]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

Is this class used on wafers or packaged parts?General reference — not yet source-verified

Machines in this class can be used in wafer-level probing or in packaged-device testing, depending on the interface and production flow.

Not publicly documented

The following facts about the V 93000 SOC Series LTH TSL 612 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the V 93000 SOC Series LTH TSL 612 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the V 93000 SOC Series LTH TSL 612 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the V 93000 SOC Series LTH TSL 612 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the V 93000 SOC Series LTH TSL 612 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the V 93000 SOC Series LTH TSL 612 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]Inventory photo
  3. [3]waferpedia.com — waferpedia.comwaferpedia.com
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Last updated Oct 13, 2026.

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