Comparison ledger
Advantest V93000 EXA Scale, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | V93000 EXA ScaleAdvantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest V93000 EXA Scale | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| OEM | Advantest[1] | — |
| Model | V93000 EXA Scale[1] | JR-A-F4T[3] |
| Product line | SoC Test Systems[1] | — |
| Description | A leading-edge semiconductor test solution that addresses the test technology challenges of next-generation SoCs[1] | — |
| Product type | SoC Test System[2] | — |
| Target devices | advanced digital ICs up to the exascale performance class[2] | — |
| Architecture | proven V93000 architecture[2] | — |
| Test-head technology | Xtreme Link technology[2] | — |
| Digital and power supply cards | EXA Scale universal digital and power supply cards[2] | — |
| Compatibility | existing V93000 load boards and Smart Scale cards are compatible[2] | — |
| Software | SmarTest software[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →