Comparison ledger
Agilent N 5172 B EXG Vector Signal, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | N 5172 B EXG Vector SignalAgilent | 1007KLA |
|---|---|---|
| OEM | Agilent | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent N 5172 B EXG Vector Signal | KLA 1007 |
| Specifications | ||
| Spec | 9 kHz - 3 GHz[1] | — |
| Firmware Rev | B.01.90[1] | — |
| Firmware Date | Mar 4, 2020[1] | — |
| Operating System | CE 7.0.2882 20190905-0841[1] | — |
| Configuration | Options installed:[1] | — |
| Frequency range | 9 kHz - 3 GHz[1] | — |
| Firmware revision | B.01.90[1] | — |
| Option 021 | Upgrade BBG memory from 32 Msa to 256 Msa[1] | — |
| Option 503 | 3 GHz frequency range[1] | — |
| Option 653 | ARB Baseband Generator (60 MHz RF, 32 Msa)[1] | — |
| Option N7612B-3TP | Connect to N5182/62 MXG, N5172 EXG[1] | — |
| Option N7612B-ETP | Basic TD-SCDMA/HSDPA[1] | — |
| Option N7612B-QTP | Advanced TD-SCDMA/HSDPA[1] | — |
| Manufacturer | — | KLA[2] |
| Model | — | 1007[2] |
| Description | — | Wafer Prober[2] |
| Wafer size | — | 150 mm[2] |
| Convertible to 8 inch wafer size | — | Yes[2] |
| Vintage | — | 01.06.1995[2] |
| Make | — | KLA[3] |
| Equipment type | — | Prober[3] |
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