Comparison ledger
Applied Materials 0010-03254 E Chuck, Keysight 4155 B Semiconductor Parameter Analyzer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03254 E ChuckApplied Materials | |
|---|---|---|
| OEM | Applied Materials | Keysight |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | — | Keysight 41xx |
| Specifications | ||
| Software Revision | — | HOSTC 02.03, SMUC 03.06, ADC 01.00[1] |
| Opt | — | 412[1] |
| Configuration | — | Unit powers on and passes all calibrated self-tests[1] |
| Option | — | Opt 412[1] |
| Condition | — | Unit powers on and passes all calibrated self-tests[1] |
| Current resolution | — | 10 fA[2] |
| Voltage resolution | — | 1 µV[2] |
| Measurement range | — | 100 V / 100 mA[2] |
| Sampling interval | — | 60 µs[2] |
| Number of sampling points | — | 10001 points[2] |
| Measurement modes | — | Staircase and pulse sweep measurement; sampling (time-domain) measurement[3] |
| Built-in units | — | Four SMUs, two VSUs, and two VMUs[3] |
| Data interfaces | — | GPIB, parallel, and 10Base-T LAN[3] |