Keysight
4155 B Semiconductor Parameter Analyzer
How it works
The HP 4155B can perform staircase sweep measurement, pulse sweep measurement, and sampling time-domain measurement using its measurement units and units in the HP 41501B expander without changing connections. Setup and measurement can be entered from front-panel keys, a keyboard, or GPIB using SCPI commands. The HP 4155B includes knob sweep capability similar to curve tracer operation. The HP 4155B displays measurement and analysis results on a color LCD and can superimpose stored graphics from four graphic memories for comparison. The HP 4155B includes automatic analysis functions for parameter extraction. The HP 4155B has a built-in HP Instrument BASIC controller and trigger I/O functions for synchronization with external instruments.[3]
The HP 4155B includes zero offset cancel for low current measurements. The HP 4155B supports auto, fixed, and limited auto range modes. The HP 4155B includes LAN capability as a standard feature. The HP 4155B includes an MS-DOS compatible disk drive and can access HP 4145B setup and measurement files from a LIF formatted disk.[2]
What do the numbers mean?
Power & electrical2
Optics & imaging1
Control & software2
Configuration & options10
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What kind of instrument is the Keysight 4155 B?
The Keysight 4155 B is a semiconductor parameter analyzer.[4][1]
What built-in measurement resources does the HP 4155B include?
The HP 4155B offers four built-in source monitor units, two voltage source units, and two voltage monitor units.[3]
What measurement modes does the HP 4155B support?
The HP 4155B can perform staircase sweep measurement, pulse sweep measurement, and sampling time-domain measurement.[3]
Not publicly documented
The following facts about the 4155 B Semiconductor Parameter Analyzer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 4155 B Semiconductor Parameter Analyzer are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 4155 B Semiconductor Parameter Analyzer are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 4155 B Semiconductor Parameter Analyzer are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 4155 B Semiconductor Parameter Analyzer are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 4155 B Semiconductor Parameter Analyzer is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (4)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]wiki.epfl.ch — wiki.epfl.chwiki.epfl.ch
- [3]testequipmenthq.com — testequipmenthq.comtestequipmenthq.com
- [4]4155 B Semiconductor Parameter Analyzer — Keysight | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
Last updated Oct 19, 2026.
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