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0010-13622 RF Match forversus790

Applied Materials 0010-13622 RF Match for, Plasma-Therm 790, side by side. Every value shown is drawn from the cited encyclopedia entries.

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Side-by-side comparison of selected equipment models
Attribute
0010-13622 RF Match forApplied Materials
790Plasma-Therm
OEMApplied MaterialsPlasma-Therm
CategoryDepositionDeposition
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0010-13622 RF Match forPlasma-Therm 790
Cited variants—
  • 790+[1]
  • Plasma-Therm 790 MF[2]
  • PlasmaTherm 790 RIE[3]
  • PlasmaTherm 790[4]
Specifications
ConfigurationHigh Efficiency HE RF Match-Bias[5]—
Model0010-13622[5]—
Product TypeRF Match for PVD (Physical Vapor Deposition)[5]—
FeatureHigh Efficiency HE RF Match-Bias[5]—
Tool name—PECVD 1 (PlasmaTherm 790)[6]
System type—open-load etch and deposition systems[1]
Series reference—formerly Plasma-Therm 790+ series[1]
Process type—PECVD[6]
Category—Chemical Vapor Deposition (CVD)[6]
Archived series reference—formerly Plasma-Therm 790+ series open-load etch and deposition systems[1]
Tool list designation—PECVD 1 (PlasmaTherm 790)[6]
Gas distribution—showerhead gas distribution[2]
Platen—water cooled RF platen[2]
Maximum wafer diameter—200 mm (8 in.)[7]
Platen size—279 mm[7]
RF power—500 W, 13.56 MHz[2]
RF power range—up to 500 W at 13.56 MHz[4]
Pressure range—10 mTorr to 100 mTorr[2]
Process gases—CF4, CHF3, SF6, and O2[2]
Material compatibility—silicon, silicon dioxide, or silicon nitride[2]
Supported sample size—200 mm maximum wafer diameter[4]

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Sources (7)Every fact above is drawn from these public sources
  1. [1]web.archive.orgweb.archive.org
  2. [2]mrl.illinois.edumrl.illinois.edu
  3. [3]research.engineering.ucdavis.eduresearch.engineering.ucdavis.edu
  4. [4]nist.govnist.gov
  5. [5]inventory listing
  6. [6]wiki.nanotech.ucsb.eduwiki.nanotech.ucsb.edu
  7. [7]cores.research.asu.educores.research.asu.edu