Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, Bruker D8D, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | D8DBruker |
|---|---|---|
| OEM | Applied Materials | Bruker |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | Bruker D8D |
| Cited variants | — |
|
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[2] | — |
| Equipment type | — | XRD system[1] |
| Setup | — | Bragg-Brentano parafocusing setup for powder analysis[1] |
| Capability | — | In situ heating analysis for bulk and powder samples[1] |
| Stage | — | Multi-sample stage with automated acquisition[1] |
| equipment type | — | X-ray diffraction system[1] |
| X-ray source | — | High intensity low-divergence collimated X-ray source[1] |
| goniometer | — | ATLAS Goniometer with non-coplanar arm[1] |
| detector | — | EIGER2 R 500K detector with 0D/1D/2D multi-mode operation[1] |
| analysis modes | — | XRR, GI-SAXS/WAXS, pole figure and residual stress analysis[1] |
| additional capabilities | — | In situ heating and electrochemical analysis[1] |
| instrument context | — | Listed under nanoFAB surface spectroscopy and X-ray diffraction capabilities[1] |
| Instrument type | — | X-Ray Diffraction (XRD) system[1] |
| Analysis techniques | — | XRR, GI-SAXS/WAXS, Pole figure and residual stress analysis[1] |
| In situ capabilities | — | In situ heating and electrochemical analysis[1] |
| Sample types | — | Powder, thin film, bulk, and colloidal samples at ambient and non-ambient conditions[1] |
| Advanced techniques | — | Non-Coplanar Scan, Pole Figure, 2D Stress Measurement, and Multi-Angle Scattering[3] |
| Analysis mode | — | In situ heating analysis for bulk and powder samples[1] |
| Acquisition | — | Multi-sample stage with automated acquisition[1] |
| Analysis capability | — | In situ heating analysis for bulk and powder samples[1] |
| Advanced XRD techniques | — | Non-Coplanar Scan, Pole Figure, 2D Stress Measurement, and Multi-Angle Scattering[3] |
| setup | — | Bragg-Brentano parafocusing setup[1] |
| application | — | powder analysis[1] |
| X-ray source type | — | High intensity low-divergence collimated X-ray source[1] |
| Analysis | — | In situ heating analysis for bulk and powder samples[1] |
| Applications | — | phase composition, particle size, crystal structure, and orientation analysis[1] |
| Operating conditions | — | ambient and non-ambient conditions[1] |
| Related system | — | Bruker D8D Plus XRD[1] |
| Measurement setup | — | Bragg-Brentano parafocusing setup for powder analysis[1] |
| Sample handling | — | Multi-sample stage with automated acquisition[1] |
| configuration | — | Bragg-Brentano parafocusing setup for powder analysis[1] |
| Optical/setup | — | Bragg-Brentano parafocusing setup for powder analysis[1] |
| Automation | — | Multi-sample stage with automated acquisition[1] |
| Capabilities | — | Analysis of phase composition, particle size, crystal structure, and orientation[1] |
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