Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, Hitachi S 3700 N, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | S 3700 NHitachi |
|---|---|---|
| OEM | Applied Materials | Hitachi |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | Hitachi S 3700 N |
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[1] | Large chamber[2] |
| Type | — | Scanning Electron Microscope (SEM)[2] |
| Wafer size | — | 12 inch[2] |
| Observable area | — | up to 203 mm in diameter[2] |
| Maximum sample height for observation and EDS analysis | — | up to 110 mm tall[2] |
| Analytical capabilities | — | EDS, EBSD and WDS simultaneously available[2] |
| Stage | — | 5-axis computer eucentric motorized stage with -20/+90* tilt[2] |
| Operating modes | — | One-button selectable High Vacuum / Low Vacuum modes[2] |
| SEM class | — | Ultra Large VP-SEM[3] |
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