Waferpedia

Comparison ledger

0010-18024 Pyrometer AssemblyversusS 4100 FE-SEM

Applied Materials 0010-18024 Pyrometer Assembly, Hitachi S 4100 FE-SEM, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
OEMApplied MaterialsHitachi
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0010-18024 Pyrometer AssemblyHitachi S 4100 FE-SEM
Specifications
ConfigurationCapable of working on Applied Materials Radiance[1]Manually operated 5 axis specimen chamber[2]
Secondary electron image resolution—2.0nm at 30 KV[2]
Magnification—20X - 300KX[2]
Electron gun—cold field emission source[2]
Lens type—electromagnetic[2]
Objective aperture—4 position externally selectable[2]
Stigmator—octopole electromagnetic[2]
Scanning coil—2-stage electromagnetic[2]
Airlock—prepumped[2]
Stage motion—5 axis manual, X/Y: 25mm, Z: 5-30mm, T: -5° - +45°, R: 360° (continuous)[2]
Draw-out door—Max sample size: 150mm diameter[2]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing