Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, Hitachi S 7840 CD-SEM, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | S 7840 CD-SEMHitachi |
|---|---|---|
| OEM | Applied Materials | Hitachi |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | Hitachi S 7840 CD-SEM |
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[1] | Refurbished[2] |
| SW Version | — | 11[2] |
| OEM | — | Hitachi[2] |
| Model | — | S 7840[2] |
| Tool type | — | Critical Dimension Scanning Electron Microscope (CD-SEM)[2] |
| Wafer sizes | — | 8, 6 inch[2] |
| Software version | — | 11[2] |
| Features | — | SECS; Multipoint Measurement; Hole Measurement; Reduced Scan; Image Database; CP Controller; Save to DOS FD; IP Read; Operator Accessories[2] |
| Vintage | — | 2001 Vintage[2] |
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