Waferpedia

Hitachi

S 7840 CD-SEM

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S 7840 CD-SEM — Inventory photo
Fig. 01S 7840 CD-SEMInventory photo[1]

How it works

The Hitachi S 7840 includes multipoint measurement, hole measurement, reduced scan, and an image database. The Hitachi S 7840 also includes a CP controller, save to DOS FD, and IP read.[2]

Applications

The Hitachi S 7840 includes hole measurement and multipoint measurement functions. The Hitachi S 7840 also includes an image database feature.[2]

What do the numbers mean?

Wafer handling1

Wafer sizes
8, 6 inch[2]
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Control & software3

CP Controller[2]
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Software version
11[2]
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Features
SECS; Multipoint Measurement; Hole Measurement; Reduced Scan; Image Database; CP Controller; Save to DOS FD; IP Read; Operator Accessories[2]
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Dimensions & facilities1

Tool type
Critical Dimension Scanning Electron Microscope (CD-SEM)[2]
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Configuration & options13

Refurbished[2]
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SW Version
11[2]
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SECS[2]
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Multipoint Measurement[2]
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Hole Measurement[2]
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Reduced Scan[2]
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Image Database[2]
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Save to DOS FD[2]
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IP Read[2]
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Operator Accessories[2]
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OEM
Hitachi[2]
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Model
S 7840[2]
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Vintage
2001 Vintage[2]
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Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What type of equipment is the Hitachi S 7840?

The Hitachi S 7840 is a critical dimension scanning electron microscope.[2]

What wafer sizes does the Hitachi S 7840 support?

The Hitachi S 7840 is configured for 6 inch and 8 inch wafers.[2]

What measurement functions are included on the Hitachi S 7840?

The Hitachi S 7840 includes multipoint measurement and hole measurement.[2]

What data or interface features are included on the Hitachi S 7840?

The Hitachi S 7840 includes SECS, an image database, save to DOS FD, and IP read.[2]

Not publicly documented

The following facts about the S 7840 CD-SEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the S 7840 CD-SEM are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the S 7840 CD-SEM are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the S 7840 CD-SEM are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the S 7840 CD-SEM are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the S 7840 CD-SEM is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]inventory listing
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Last updated Oct 15, 2026.

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