Comparison ledger
Applied Materials 0010-22161 High EFF RF Match, Veeco 4-point, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-22161 High EFF RF MatchApplied Materials | 4-pointVeeco |
|---|---|---|
| OEM | Applied Materials | Veeco |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-22161 High EFF RF Match | Veeco 4-point |
| Specifications | ||
| Make | Applied Materials[1] | — |
| Model | 0010-22161[1] | — |
| Description | HTESC PH 1 REV A[2] | — |
| Condition | Used[2] | — |
| Stock Number | BM6628[2] | — |
| Listed in metrology suite | — | Veeco 4-point probe[3] |
| Maximum substrate size | — | 6 inch[4] |
| Measurement capabilities | — | Sheet resistance, slice resistivity, V/I, metallization thickness, P‑N type testing[5] |
| Probe mechanism | — | Wafer is moved into the probe head, not vice versa[5] |
| Measurement Capabilities | — | Sheet resistivity, slice resistivity, metallization thickness, P-N type testing[5] |