Comparison ledger
Applied Materials 0720 06060 Part, Keysight 4145 B Semiconductor Parameter Analyzer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | |
|---|---|---|
| OEM | Applied Materials | Keysight |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Keysight 41xx |
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[1] | Fully automatic, high-speed dc characterization of semiconductor devices[2] |
| Manufacturer | — | Keysight / Agilent[2] |
| Model | — | 4145 B[2] |
| Instrument type | — | Semiconductor Parameter Analyzer[2] |
| Mode | — | Fully automatic[2] |
| Function | — | High-speed DC characterization of semiconductor devices[2] |
| Sourcing and measurement | — | High resolution, wide range sourcing and measurement[3] |
| Measurement and display points | — | Maximum 1150[2] |
| Analysis functions | — | Flexible graphic analysis functions for quick parameter extraction[2] |
| Storage / drive | — | Built-in micro flexible disc drive[2] |
| Sourcing and measurement range | — | 50 fA to 100 mA and 1 mV to 100 V[4] |
| Program storage | — | Floppy disk drive stores 240 user programs or 105 measurement results[4] |
| Family | — | Keysight 41xx family[3] |
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