Keysight
4145 B Semiconductor Parameter Analyzer
What is it?
What do the numbers mean?
Optics & imaging1
- High resolution, wide range sourcing and measurement[1]
Configuration & options4
- Fully automatic, high-speed dc characterization of semiconductor devices[1]
- Maximum 1150 measurement and display points for precise measurement and analysis[1]
- Flexible graphic analysis functions for quick parameter extraction[1]
- Built-in micro flexible disc drive[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Not publicly documented
The following facts about the 4145 B Semiconductor Parameter Analyzer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 4145 B Semiconductor Parameter Analyzer are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 4145 B Semiconductor Parameter Analyzer are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 4145 B Semiconductor Parameter Analyzer are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 4145 B Semiconductor Parameter Analyzer are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 4145 B Semiconductor Parameter Analyzer is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Equipment inventory listing
Last updated Jul 29, 2026.
Compare with similar tools
View all →The KLA .498 PSL Wafer is a NIST traceable reference wafer.
The Applied Materials 0010-47763 is an electrostatic chuck (ESC) assembly used in semiconductor etching processes.
