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Comparison ledger

0720 06060 PartversusH-100

Applied Materials 0720 06060 Part, Signatone H-100, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0720 06060 PartApplied Materials
H-100Signatone
OEMApplied MaterialsSignatone
CategoryTest & ProbeTest & Probe
Wafer size—three inch square device / substrate chuck
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0720 06060 PartSignatone H-100
Cited variants—
Specifications
ConfigurationContact Pin 24-20 Awg Crimp Gold Flash[2]—
device/substrate chuck—three inch square[3]
primary applications—probing thick film devices such as ceramic substrates, printed circuit boards and hybrid circuits[3]
series variants—H-100, H-120 and H-150[3]
device stage travel—four inches of X-Y travel[3]
platen motion—linear motion platen that can be raised and lowered using either a crank or a lever[3]
microscope tower—for mounting Stereozoom optics in a fixed position[3]
optional microscope stage—4" x 4" microscope stage[3]
micropositioners—up to six magnetic based micropositioners[3]
probe card adapter—accepts a probe card adapter for use with probe cards[3]
micropositioner electrical connections—six pin jacks that correspond to color coded banana plugs[3]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]web.archive.orgweb.archive.org
  2. [2]inventory listing
  3. [3]web.archive.orgweb.archive.org