Waferpedia

Signatone

H-100

H-100 — web.archive.org
Fig. 01H-100web.archive.org[1]

What it is

The Signatone H-100 is a probe station. The H-100 series includes three versions: H-100, H-120, and H-150.[1][2]

The station includes an aluminum base casting, a device stage with four inches of X-Y travel, a linear motion platen, and a microscope tower for mounting Stereozoom optics in a fixed position. An optional 4 inch by 4 inch microscope stage is also described.[1][2]

How it works

The linear motion platen can be raised and lowered using either a crank or a lever. The platen accepts up to six magnetic-based micropositioners and a probe card adapter for use with probe cards.[1][2]

Micropositioner electrical connections are made through six pin jacks that correspond to color-coded banana plugs.[1][2]

Where it fits in the process flow

The H-100 series is primarily designed for probing thick film devices such as ceramic substrates, printed circuit boards, and hybrid circuits. The H-100 and H-120 use a three inch square device or substrate chuck.[1][2]

The H-150 system in the same series can be equipped with a four inch diameter wafer chuck for probing wafers up to four inches in diameter.[1][2]

Applications

Stated application areas include probing thick film devices, ceramic substrates, printed circuit boards, hybrid circuits, and wafers up to four inches in diameter when the H-150 system is fitted with the wafer chuck.[1][2]

  • probing thick film devices
  • probing ceramic substrates
  • probing printed circuit boards
  • probing hybrid circuits

What do the numbers mean?

Power & electrical1

micropositioner electrical connections
six pin jacks that correspond to color coded banana plugs[1]
Accurate?

Wafer handling2

device/substrate chuck
three inch square[1]
Accurate?
primary applications
probing thick film devices such as ceramic substrates, printed circuit boards and hybrid circuits[1]
Accurate?

Optics & imaging1

microscope tower
for mounting Stereozoom optics in a fixed position[1]
Accurate?

Configuration & options6

series variants
H-100, H-120 and H-150[1]
Accurate?
device stage travel
four inches of X-Y travel[1]
Accurate?
platen motion
linear motion platen that can be raised and lowered using either a crank or a lever[1]
Accurate?
optional microscope stage
4" x 4" microscope stage[1]
Accurate?
micropositioners
up to six magnetic based micropositioners[1]
Accurate?
probe card adapter
accepts a probe card adapter for use with probe cards[1]
Accurate?

Vintage & configurations

Documented models & variants

DesignationGenerationVintageChangesSource
H-100web.archive.org[2]
H-120web.archive.org[2]
H-150can be equipped with a four inch diameter wafer chuck for probing wafers up to four inches in diameterweb.archive.org[2]
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • micropositioner electrical connectionssix pin jacks that correspond to color coded banana plugs[1]

Where are the manuals?

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Not publicly documented

Field notes

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Not publicly documented

The following facts about the H-100 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the H-100 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • The control-system platform and OS era of the H-100 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the H-100 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the H-100 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the H-100 are on record.

    Answerable by: an OEM parts catalog or a service engineer

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Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]web.archive.orgweb.archive.orgweb.archive.org
  2. [2]web.archive.orgweb.archive.orgweb.archive.org
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Last updated Jul 29, 2026.

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