Comparison ledger
Bruker Contour X, Perkin Elmer 1050 UV-VIS, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Contour XBruker | 1050 UV-VISPerkin Elmer |
|---|---|---|
| OEM | Bruker | Perkin Elmer |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Bruker Contour X | Perkin Elmer 1050 UV-VIS |
| Specifications | ||
| Category | Metrology[1] | — |
| Subcategory | Optical measurement[1] | — |
| Documentation | User Manual; Datasheet; Manufacturer's Manual (Contour GT-K, similar model)[1] | — |
| Instrument type | Optical measurement[1] | Spectrometer[5] |
| Section | Metrology[1] | — |
| Facility | Center of MicroNanoTechnology[1] | — |
| Associated documents | User Manual; Datasheet; Manufacturer's Manual (Contour GT-K, similar model)[1] | — |
| equipment type | optical measurement[1] | — |
| software | Vision 64[1] | — |
| Product line | ContourX benchtop optical profilometer product line[2] | — |
| Product description | Fully automated benchtop for 3D metrology[3] | — |
| Operating principle | White-light interferometry (WLI), non-contact[4] | — |
| Asset ID | — | 82948[5] |
| Last Confirm Date | — | August 23, 2024[5] |
| Manufacturer | — | Perkin Elmer[5] |
| Model | — | 1050[5] |
| Use | — | Analyzing ultraviolet and visible light absorption spectra[5] |
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