Bruker
Contour X
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Bruker Contour X is an optical measurement instrument used in metrology.[1]
Plate 013D Optical Profilometer | ContourX-500 Product Overview | Bruker
Bruker Nano Surfaces & MetrologyWatch on YouTube
What it is
The Bruker Contour X is an optical measurement instrument used in the Metrology area of the Center of MicroNanoTechnology at EPFL.[1]
Where it fits in the process flow
It is grouped under Process Metrology and Optical measurement, indicating a metrology role within the equipment set.[1]
What do the numbers mean?
Optics & imaging4
Control & software1
Configuration & options7
What replaced it?
Related models
- siblingNanospec AFT-6100— Listed in the same optical measurement section of the EPFL CMi equipment portfolio as the Nanospec AFT-6100.source[5]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the Contour X are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Contour X are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Contour X are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Contour X are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Contour X are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Contour X is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (6)Every fact above is drawn from these public sources
- [1]epfl.ch — epfl.chepfl.ch
- [2]bruker.combruker.com
- [3]bruker.combruker.com
- [4]instrumenthive.cominstrumenthive.com
- [5]epfl.chepfl.ch
- [6]Contour X — Bruker | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
Last updated Oct 19, 2026.
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