Comparison ledger
Cascade Microtech 208, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 208Cascade Microtech | |
|---|---|---|
| OEM | Cascade Microtech | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | Windows 10 | — |
| Generation | — | — |
| Family | Cascade Microtech 208 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| role | Kelvin probe positioner[1] | — |
| system context | Used on an HFTL DC Probe Station built around a Cascade Summit 12K probe station[1] | — |
| quantity in described setup | four Kelvin probes each mounted on a Cascade 208 or 210 probe positioner[1] | — |
| Type | test and probe instrument[2] | — |
| Function | probe positioner used on a probe station for semiconductor electrical testing[3] | — |
| Configuration role | role Kelvin probe positioner[2] | — |
| Control-system era | Windows 10[2] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Model | — | JR-A-F4T[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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