Comparison ledger
Cascade Microtech 300, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 300Cascade Microtech | |
|---|---|---|
| OEM | Cascade Microtech | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | 300mm | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cascade Microtech 300 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants | — | |
| Specifications | ||
| Wafer size | ≤ 300 mm[1] | — |
| CM300 description | Flexible on-wafer probe system[1] | — |
| Control software | Velox™ probe station control software[1] | — |
| Automation/features | Safe and fast wafer loading and easy test automation and measurement[1] | — |
| Application | On-wafer test[1] | — |
| Position in product line | 300 mm probing solutions[1] | — |
| Positioning | precision and versatility[1] | — |
| Testing scope | a wide range of advanced, complex testing requirements[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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