Cascade Microtech

300

Test & Probe 300mm Cascade Microtech 300 family

Research Quality: 40% complete

300 — web.archive.org — Fig. 01300web.archive.org^[1]

What is it?

The sources describe the Cascade Microtech 300 mm probing line as a set of on-wafer probe stations/probe systems for 300 mm wafers. The CM300 is described as a flexible on-wafer probe system that scales to evolving needs and supports safe, fast wafer loading and test automation with Velox™ probe station control software. The line is also presented as suitable for a wide range of advanced testing applications, including RF/DC characterization, wafer-level reliability, failure analysis, and design debug.

What can it run?

Process applications and technology nodes documented for this tool.

RF/DC device characterization
wafer-level reliability
IC failure analysis and design debug

What do the numbers mean?

Wafer handling3

Wafer size: ≤ 300 mm^[1]
CM300 description: Flexible on-wafer probe system^[1]
Automation/features: Safe and fast wafer loading and easy test automation and measurement^[1]

Control & software1

Control software: Velox™ probe station control software^[1]

Vintage & configurations

Documented models & variants

Designation	Generation	Vintage	Changes	Source
CM300	—	—	Described as a flexible on-wafer probe system that scales to meet evolving needs.	web.archive.org^[1]
Elite 300	—	—	Described as a probe station for RF/DC device characterization, wafer-level reliability, IC failure analysis, and design debug.	web.archive.org^[1]
PM300	—	—	Described as a manual probe station for semiconductor failure analysis and in-process testing.	web.archive.org^[1]
PA300	—	—	Described as a semi-automatic probe system configured with a vast array of accessories for wafer-level test.	web.archive.org^[1]

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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Not publicly documented

The following facts about the 300 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 300 are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the 300 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 300 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 300 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the 300 are on record.
Answerable by: an OEM parts catalog or a service engineer

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Sources & citations

Sources (3)Every fact above is drawn from these public sources

[1]web.archive.org — web.archive.orgweb.archive.org
[2]High Performance Probe Systems | On Wafer Probe Stations | Cascade Microtech, Inc. — web.archive.orgweb.archive.org
[3]High Performance Probe Systems | On Wafer Probe Stations | Cascade Microtech, Inc. — web.archive.orgweb.archive.org