Comparison ledger
Cohu MT9510, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | MT9510Cohu | |
|---|---|---|
| OEM | Cohu | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cohu MT9510 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants | — | |
| Specifications | ||
| OEM | Cohu[2] | — |
| Model | MT9510[2] | JR-A-F4T[5] |
| Product grouping | Test Handlers[2] | — |
| Equipment type | test handler[3] | — |
| Handler type | pick-and-place[1] | — |
| Temperature range | -55°C to +175°C[1] | — |
| Throughput | up to 5,300 UPH[1] | — |
| Test site parallelism | up to x16[1] | — |
| Index time | 0.38 seconds (XP)[1] | — |
| Package size range | 3 x 3 mm to 70 x 70 mm[1] | — |
| Device size range | 3 mm x 3 mm to 70 mm x 70 mm[4] | — |
| Package styles | QFP, BGA, Micro-BGA, CSP, TSSOP, PLCC, PGA, LGA, MLP/MLF[1] | — |
| Kitable system packages | QFP, BGA, PGA, QFN and other packages[4] | — |
| Temperature stability | ±0.5°C[4] | — |
| Temperature accuracy | ±2.0°C[4] | — |
| Footprint | 1.19 m x 1.57 m (47" x 62")[1] | — |
| Weight | 850 kg (1,900 lbs)[4] | — |
| Power supply | 400 V AC 3 phases/N/PE, 16 Amps each[4] | — |
| Power consumption | max. 5,200 W[4] | — |
| LN2 consumption | Typ. 18 l/h for cold operation; typ. 33 l/h for cooling down from ambient to -55°C[4] | — |
| Compressed air pressure | 5 to 10 bar (70 to 145 psi)[4] | — |
| Compressed air consumption | 170 l/min to 940 l/min[4] | — |
| Loading/unloading | All commonly used trays acc. to JEDEC standard CO-012, CO-029 and CO-034[4] | — |
| Loader type | tray stack, separate input/output tray loop[4] | — |
| Contact modes | Parallel; Ping-pong[4] | — |
| Applications | short contact ambient (plunge to board); short contact tri-temp (plunge to board); standard (including temperature insulation and hot air purge)[4] | — |
| Bin categories | High volume plus 3 or 6 manual categories; software binning categories: 32[4] | — |
| Docking height | 990 mm (floor to CUH center)[4] | — |
| Standards | CE; SEMI S2-93 assessment[4] | — |
| Chamber Size | — | 1.2 cubic feet[5] |
| Temperature Range | — | -68°C to +180°C[5] |
| Control | — | +/-1.0°C[5] |
| Manufacturer | — | Tenney[5] |
| Short description | — | Junior compact temperature test chambers[5] |
| Control accuracy | — | +/-1.0°C[5] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →