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Power
400 V AC 3 phases/N/PE, 16 Amps each[4]
Vacuum
5 to 10 bar (70 to 145 psi)[4]
Performance
up to 5,300 UPH[3]
Test handlers move semiconductor devices between media, present each device to the electrical interface, and sort devices after test according to the test outcome. Pick-and-place handlers are used for packaged parts rather than wafers, and they form part of back-end electrical test operations between package handling and final device disposition.
The MT9510 XP supports short-contact ambient and short-contact tri-temp test using plunge-to-board contacting. The MT9510 XP uses a flat vertical contact site. The MT9510 XP supports standard, high-frequency, and Kelvin contacting. The MT9510 XP supports automatic tray module and single-tray output versions.[4]
Package test takes place after assembly and before final device release, and the broader package-test flow follows wafer test and package assembly. A test handler such as the MT9510 fits at the packaged-device electrical test stage, where devices are inserted into a contactor for automated test and then sorted based on results.[5]
Packaged-device handlers are used where singulated semiconductor parts need repeatable electrical contact under controlled handling and thermal conditions. Such tools are common in production test for logic, analog, power, sensor, and mixed-signal packages, especially when package style or test temperature must be managed by the handler.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
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The following facts about the MT9510 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the MT9510 are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the MT9510 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the MT9510 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the MT9510 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the MT9510 are on record.
Answerable by: an OEM parts catalog or a service engineer
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Last updated Oct 16, 2026.
The Tenney TPS JR-A-F4T is a junior compact temperature test chamber with a 1.2 cubic foot chamber size and a temperature range of -68°C to +180°C.
The KLA 1007 is a wafer prober manufactured by KLA.