Comparison ledger
CyberOptics SQ 3000 3D AOI SPI, KLA 1.112 PSL Wafer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | SQ 3000 3D AOI SPICyberOptics | |
|---|---|---|
| OEM | CyberOptics | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | CyberOptics SQ 3000 | KLA 1.112 PSL Wafer |
| Specifications | ||
| Configuration | Inline[1] | NIST Traceable[3] |
| Manufacturer | CyberOptics[2] | — |
| Model | SQ 3000[2] | — |
| Full designation | SQ 3000 3D AOI SPI[1] | — |
| Tool type | Automated optical inspection (AOI) and solder paste inspection (SPI) system[1] | — |
| Vintage | 2018[2] | — |
| Wafer Size | — | 8 inch[3] |
| NIST Traceable | — | True[3] |
| Compatible Tools | — | Surfscan 6xy0 and Sp1[4] |
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