Comparison ledger
CyberOptics SQ 3000 3D AOI, KLA .204 PSL Wafer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | SQ 3000 3D AOICyberOptics | |
|---|---|---|
| OEM | CyberOptics | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | CyberOptics SQ 3000 | KLA .204 PSL Wafer |
| Specifications | ||
| P/N | 8021880[1] | — |
| Configuration | PSX3D Multi Camera + Projector 3D Sensor featuring MRS Technology[1] | NIST Traceable[4] |
| Workstation (P/N | 8022409):[1] | — |
| CyberReport SPC Software (P/N | 80022384):[1] | — |
| OEM | CyberOptics[1] | — |
| Model | SQ 3000 3D AOI[1] | — |
| Inspection type | Automated Optical Inspection (AOI)[2] | — |
| Sensor | PSX3D multi-camera + projector 3D sensor featuring MRS Technology[2] | — |
| Inspection capability | 20 x 20 in[2] | — |
| Conveyor | Auto-width adjust conveyor[1] | — |
| Board stop | Mechanical board stop[1] | — |
| Software | AI image analysis software[1] | — |
| User interface | Localized operator user interface[1] | — |
| Included monitor | Touch screen monitor[1] | — |
| Default conveyor direction | Left to right movement[1] | — |
| Workstation | Offline programming and defect review workstation included[1] | — |
| CyberReport SPC software | Machine-level SPC software with historical charting analysis and USB license dongle[1] | — |
| Inspection speed | 15 cm²/sec (2D+3D)[3] | — |
| Minimum component size | 0201 mm (008004 in.)[3] | — |
| PCB size | 50 x 50 mm (2 x 2 in.) to 510 x 510 mm (20 x 20 in.)[3] | — |
| Component height clearance | 50 mm[3] | — |
| PCB thickness | 0.3 x 5 mm[3] | — |
| Image processing | Autonomous Image Interpretation (AI2) Technology, Coplanarity and Lead Measurement[3] | — |
| CMM accuracy XY / Z | 2 μm / 2 μm[3] | — |
| CMM resolution XY / Z | 7 μm / 1 μm[3] | — |
| Z height accuracy | 1 μm on certification target[3] | — |
| Z height measurement range | 3 mm at spec, 10 mm capability[3] | — |
| Wafer Size | — | 8 inch[5] |
| Traceability | — | NIST[6] |
| Compatible Tools | — | Surfscan 6xy0, Sp1[4] |
| NIST Traceable | — | Yes[5] |
| Compatible tools | — | Surfscan 6xy0 and Sp1 particle counters[5] |
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