Comparison ledger
Eagle ETS 200 T, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ETS 200 TEagle | |
|---|---|---|
| OEM | Eagle | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Eagle ETS 200 T | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants |
| — |
| Specifications | ||
| Configuration | with Electroglas EG 4090 Prober[2] | — |
| Vintage | 2006[2] | — |
| Product type | Tester[2] | — |
| Model | ETS 200 T[2] | JR-A-F4T[3] |
| Make | Eagle[2] | — |
| Discrete test platform | Built on proven ETS technology[1] | — |
| Testing mode | True index-parallel testing[1] | — |
| Handler compatibility | Turret and rotary handlers[1] | — |
| Applications | Wafer sort to final test for MOSFETs[1] | — |
| Integrated measurements | UIL, dVSD, Qg and LCR meter[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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