Comparison ledger
Electroglas 1034, Keysight F 9650 A Compact Antenna Test Range (CATR), side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1034Electroglas | |
|---|---|---|
| OEM | Electroglas | Keysight |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Electroglas 1034 | Keysight F 9650 A Compact Antenna Test Range (CATR) |
| Specifications | ||
| Configuration | — | Millimeter-wave over-the-air measurement chamber[1] |
| Frequency range | — | 6-110 GHz[1] |
| Focal length | — | 1.02m[1] |
| Edge treatment | — | rolled edge[1] |
| Manufacturer | — | Keysight[1] |
| Model | — | F 9650 A[1] |
| Category | — | Test & Probe[2] |
| System type | — | Millimeter-wave over-the-air measurement chamber[1] |
| Chamber type | — | Shielded anechoic chamber[1] |
| Reflector | — | Rolled-edge parabolic reflector[1] |
| Feed horn assembly | — | Dual polarized feed horn assembly with roll motor[1] |
| DUT positioner | — | Roll-over-azimuth DUT positioner[1] |
| Controller | — | Controller for feed and device under test (DUT) positioners with triggered data acquisition capability[1] |
| Probe feed options | — | In-band and spurious test frequency ranges[1] |
| Calibration | — | Calibration kits for chamber validation and calibration[1] |
| Lighting | — | LED lighting[1] |
| Camera | — | USB camera[1] |
| Alignment aid | — | Crosshair laser guide for DUT alignment[1] |
| Control software | — | Chamber control software[1] |
| Reflector frequency range | — | 6-110 GHz[1] |
| Reflector focal length | — | 1.02m[1] |
| Reflector edge treatment | — | Rolled edge[1] |
| Condition note | — | Minor water exposure[1] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →